paper

Observation of Ultrafast Free Carrier Dynamics in Single Layer MoS

arXiv:1508.07301 · doi:10.1021/acs.nanolett.5b01967

Abstract

The dynamics of excited electrons and holes in single layer (SL) MoS have so far been difficult to disentangle from the excitons that dominate the optical response of this material. Here, we use time- and angle-resolved photoemission spectroscopy for a SL of MoS on a metallic substrate to directly measure the excited free carriers. This allows us to ascertain a direct quasiparticle band gap of 1.95 eV and determine an ultrafast (50 fs) extraction of excited free carriers via the metal in contact with the SL MoS. This process is of key importance for optoelectronic applications that rely on separated free carriers rather than excitons.

15 pages, 4 Figures. To appear in Nano Letters, 2015

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