Scanning probe microscopy and spectroscopy of graphene on metals
arXiv:1502.00411 · doi:10.1002/pssb.201451466
Abstract
Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the corresponding spectroscopy add-ons provide information about the structure and electronic properties of graphene on the local scale (from inline imagem to atoms). This review focuses on the recent applications of these microscopic/spectroscopic methods for the investigation of graphene on metals (interfaces, intercalation-like systems, graphene nanoribbons, and quantum dots, etc.). It is shown that very important information about interaction strength at the graphene/metal interfaces as well as about modification of the electronic spectrum of graphene at the Fermi level can be obtained on the local scale. The combination of these results with those obtained by other methods and comparison with recent theoretical data demonstrate the power of this approach for the investigation of the graphene-based systems.
arXiv commentFeature Article in pss (b)
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