Checkerboard stripe electronic state on cleaved surface of NdO$_{0.7}$F$_{0.3}$BiS$_{2}$ probed by scanning tunneling microscope

T. Machida; Y. Fujisawa; M. Nagao; S. Demura; K. Deguchi; Y. Mizuguchi; Y. Takano; H. Sakata

doi:10.7566/JPSJ.83.113701

paper

Checkerboard stripe electronic state on cleaved surface of NdO $_{0.7}$ F $_{0.3}$ BiS $_{2}$ probed by scanning tunneling microscope

arXiv:1403.6110 · doi:10.7566/JPSJ.83.113701

Abstract

We present scanning tunneling microscopy measurements on a cleaved surface of the recently discovered superconductor NdO $_{0.7}$ F $_{0.3}$ BiS $_{2}$ with a transition temperature ( $T_{c}$ ) of 5.1 K.Tunneling spectra at 4.2 K (below $T_{c}$ ) and 22 K (above $T_{c}$ ) show a large spectroscopic gap ( $\sim$ 40 mV), which is inconsistent with the metallic nature demonstrated in bulk measurements. Moreover, we find two interesting real-space electronic features. The first feature is a `checkerboard stripe' electronic state characterized by an alternating arrangement of two types of nanocluster. In one cluster, one-dimensional electronic stripes run along one Bi-Bi direction, whereas, in the other cluster, the stripes run along the other Bi-Bi direction. The second feature is a nanoscale electronic inhomogeneity whose microscopic source seems to be atomic defects on the cleaved surface or dopant F atoms.

5 pages, 4 figures

Checkerboard stripe electronic state on cleaved surface of NdO $_{0.7}$ F $_{0.3}$ BiS $_{2}$ probed by scanning tunneling microscope

Abstract

References in corpus (12)

Cited by in corpus (12)

Checkerboard stripe electronic state on cleaved surface of NdO0.7​F0.3​BiS2​ probed by scanning tunneling microscope

Abstract

References in corpus (12)

Cited by in corpus (12)

Checkerboard stripe electronic state on cleaved surface of NdO $_{0.7}$ F $_{0.3}$ BiS $_{2}$ probed by scanning tunneling microscope