Microwave manipulation of electrically injected spin polarized electrons in silicon
arXiv:1312.3663
Abstract
We demonstrate microwave manipulation of the spin states of electrically injected spin-polarized electrons in silicon. Although the silicon channel is bounded by ferromagnetic metal films, we show that moderate microwave power can be applied to the devices without altering the device operation significantly. Resonant microwave irradiation is used to induce spin rotation of spin-polarized electrons as they travel across a silicon channel, and the resultant spin polarization is subsequently detected by a ferromagnetic Schottky barrier spin detector. These results demonstrate the potential for combining advanced electron spin resonance techniques to complement the study of semiconductor spintronic devices beyond standard magnetotransport measurements.
5 pages, 4 figures
References in corpus (8)
- Electrical Detection of Spin Transport in Lateral Ferromagnet-Semiconductor Devices
- Electronic measurement and control of spin transport in Silicon
- Coherent spin transport through a 350-micron-thick Silicon wafer
- Theory of the spin relaxation of conduction electrons in silicon
- Spin polarized electron transport near the Si/SiO2 interface
- Field-induced negative differential spin lifetime in silicon
- The Larmor clock and anomalous spin dephasing in silicon
- Electrically detected magnetic resonance of neutral donors interacting with a two-dimensional electron gas