Surface structure of Bi2Se3(111) determined by low-energy electron diffraction and surface X-ray diffraction
arXiv:1306.3310 · doi:10.1103/PhysRevB.88.041404
Abstract
The surface structure of the prototypical topological insulator Bi2Se3 is determined by low-energy electron diffraction and surface X-ray diffraction at room temperature. Both approaches show that the crystal is terminated by an intact quintuple layer. Specifically, an alternative termination by a bismuth bilayer is ruled out. Surface relaxations obtained by both techniques are in good agreement with each other and found to be small. This includes the relaxation of the van der Waals gap between the first two quintuple layers.
References in corpus (10)
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Cited by in corpus (14)
- Direct Measurement of Surface Transport on a Bulk Topological Insulator
- Intra- and Interband Electron Scattering in the Complex Hybrid Topological Insulator Bismuth Bilayer on BiSe
- Absence of superconductivity in ultra-thin layers of FeSe synthesized on a topological insulator
- Termination of Single Crystal Bi2Se3 Surfaces Prepared by Various Methods
- Preparation of clean surfaces and Se vacancy formation in BiSe by ion bombardment and annealing
- Surface Structure of In Situ Cleaved Single Crystal Bi2Se3 Measured by Low Energy Ion Scattering
- The growth of bismuth on BiSe and the stability of the first bilayer
- Spatial Distribution of Topological Surface State Electrons in BiSe Probed by Na Low Energy Ion Scattering
- Spatial Distribution of Topological Surface State Electrons in BiTe Probed by Low Energy Na Ion Scattering
- Band structure of Bi surfaces formed on Bi2Se3 upon exposure to air
- Conductance Oscillations in a Topological Insulator-Disordered Superconductor Hybrid Interface
- Halogen adsorption and reaction with Bi(Se,Te) and Bi/Bi(Se,Te)
- Aging of the surface of Bi(2)Se(3)
- Tracking the surface atomic motion in a coherent phonon oscillation