Strengthening weak value amplification with recycled photons
arXiv:1305.4520 · doi:10.1103/PhysRevA.88.023821
Abstract
We consider the use of cyclic weak measurements to improve the sensitivity of weak-value amplification precision measurement schemes. Previous weak-value experiments have used only a small fraction of events, while discarding the rest through the process of "post-selection". We extend this idea by considering recycling of events which are typically unused in a weak measurement. Here we treat a sequence of polarized laser pulses effectively trapped inside an interferometer using a Pockels cell and polarization optics. In principle, all photons can be post-selected, which will improve the measurement sensitivity. We first provide a qualitative argument for the expected improvements from recycling photons, followed by the exact result for the recycling of collimated beam pulses, and numerical calculations for diverging beams. We show that beam degradation effects can be mitigated via profile flipping or Zeno reshaping. The main advantage of such a recycling scheme is an effective power increase, while maintaining an amplified deflection.
13 pages, 8 figures
References in corpus (6)
- Ultrasensitive Beam Deflection Measurement via Interferometric Weak Value Amplification
- Optimizing the Signal to Noise Ratio of a Beam Deflection Measurement with Interferometric Weak Values
- Precision frequency measurements with interferometric weak values
- Measuring ultrasmall time delays of light by joint weak measurements
- Demonstration of a squeezed light enhanced power- and signal-recycled Michelson interferometer
- Picoradian deflection measurement with an interferometric quasi-autocollimator using weak value amplification
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