Achieving metrological precision limits through post-selection

Abstract

Post-selection strategies have been proposed with the aim of amplifying weak signals, which may help to overcome detection thresholds associated with technical noise in high-precision measurements. Here we use an optical setup to experimentally explore two different post-selection protocols for the estimation of a small parameter: a weak-value amplification procedure and an alternative method, that does not provide amplification, but nonetheless is shown to be more robust for the sake of parameter estimation. Each technique leads approximately to the saturation of quantum limits for the estimation precision, expressed by the Cramér-Rao bound. For both situations, we show that information on the parameter is obtained jointly from the measuring device and the post-selection statistics.

9 pages, 9 figures

References in corpus (3)

• Optimizing the Signal to Noise Ratio of a Beam Deflection Measurement with Interferometric Weak Values
• Weak-value amplification as an optimal metrological protocol
• Quantum sensors based on weak-value amplification cannot overcome decoherence

Cited by in corpus (12)

• Weak value controversy
• Quantum-Enhanced Sensing from Hyper-Entanglement
• Practical Advantages of Almost-Balanced-Weak-Values Metrological Techniques
• Robust interferometric sensing using two-photon interference
• Time-frequency metrology with two single-photon states: phase space picture and the Hong-Ou-Mandel interferometer
• Modular-value-based metrology with spin coherent pointers
• Robustness of optic-fiber-based weak value amplification against amplitude-type noise
• Interferometric sensing of the tilt angle of a Gaussian beam
• Probabilistic magnetometry with two-spin system in diamond
• Weak Particle Presence
• Multiparameter quantum metrology with postselection measurements
• The Informational Observer in Relational Quantum Mechanics