Many Topological Insulators Fail the Surface Conduction Test

Abstract

In this report, we scrutinize the thickness dependent resistivity data from the recent literature on electrical transport measurements in topological insulators. A linear increase in resistivity with increase in thickness is expected in the case of these materials since they have an insulating bulk and conducting surface. However, such a trend is not seen in the resistivity versus thickness data for all the cases examined, except for some samples, where it holds for a narrow range of thickness.

11 pages, 3 figures

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• Many Topological Insulators Fail the Surface Conduction Test

Cited by in corpus (4)

• Evidence for topological surface states in metallic single crystals of Bi2Te3
• Many Topological Insulators Fail the Surface Conduction Test
• All-electrical spin-to-charge conversion in sputtered Bi${}_x$Se${}_{1-x}$
• Quantification of spin-charge interconversion in highly resistive sputtered Bi${}_x$Se${}_{1-x}$ with non-local spin valves