Nanolithography and manipulation of graphene using an atomic force microscope
arXiv:0806.0716 · doi:10.1016/j.ssc.2008.06.027
Abstract
We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possibility of tabletop graphene based device fabrication. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation we also show the influence of mechanical peeling and scratching with an AFM of few layer graphene sheets placed on different substrates.
11 pages text, 5 figures
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- From One Electron to One Hole: Quasiparticle Counting in Graphene Quantum Dots Determined by Electrochemical and Plasma Etching
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- Atomic force microscope nanolithography of graphene: cuts, pseudo-cuts and tip current measurements
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- Mixing of Edge States at a Bipolar Graphene Junction
- First-principles modeling of the interactions of iron impurities with graphene and graphite
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