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20082026
most citedGraphene-Based Integrated Photonics For Next-Generation Datacom And Telecom

412 citations

Showing 2024 · physics.app-phShow all

7 papers · 2 filters

physics.app-ph2024★ 5 cited

Dry Transfer Based on PMMA and Thermal Release Tape for Heterogeneous Integration of 2D-TMDC Layers

Amir Ghiami, Hleb Fiadziushkin, Tianyishan Sun +9

A reliable and scalable transfer of 2D-TMDCs (two-dimensional transition metal dichalcogenides) from the growth substrate to a target substrate with high reproducibility and yield…

physics.app-ph2024★ 10 cited

Piezoresistive PtSe pressure sensors with reliable high sensitivity and their integration into CMOS ASIC substrates

Sebastian Lukas, Nico Rademacher, Sofía Cruces +14

Membrane-based sensors are an important market for microelectromechanical systems (MEMS). Two-dimensional (2D) materials, with their low mass, are excellent candidates for suspende…

physics.app-ph2024★ 26 cited

High-yield large-scale suspended graphene membranes over closed cavities for sensor applications

Sebastian Lukas, Ardeshir Esteki, Nico Rademacher +10

Suspended membranes of monoatomic graphene exhibit great potential for applications in electronic and nanoelectromechanical devices. In this work, a "hot and dry" transfer process…

physics.app-ph2024★ 22 cited

Volatile MoS Memristors with Lateral Silver Ion Migration for Artificial Neuron Applications

Sofia Cruces, Mohit D. Ganeriwala, Jimin Lee +12

Layered two-dimensional (2D) semiconductors have shown enhanced ion migration capabilities along their van der Waals (vdW) gaps and on their surfaces. This effect can be employed f…

physics.app-ph2024★ 2 cited

Measuring the Adhesion of Graphene Flake Networks via Button Shear Tests

Jorge Eduardo Adatti Estévez, Josef Schätz, Jasper Ruhkopf +5

Graphene flake-based dispersions are attractive materials for various applications in microelectronics because of their ease of fabrication and the potential to deposit them on div…

physics.app-ph2024★ 1 cited

Multiparameter admittance spectroscopy for investigating defects in MoS thin film MOSFETs

Eros Reato, Ardeshir Esteki, Benny Ku +4

A method for assessing the quality of electronic material properties of thin-film metal oxide semiconductor field-effect transistors (MOSFETs) is presented. By investigating sample…