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20052026
most citedUltra-low threshold cw and pulsed lasing in tensile strained GeSn alloys

235 citations

Showing physics.app-phShow all

9 papers · 1 filter

physics.app-ph2021★ 29 cited

Ultrahigh-sensitivity optical power monitor for Si photonic circuits

Takaya Ochiai, Kei Sumita, Shuhei Ohno +5

A phototransistor is a promising candidate as an optical power monitor in Si photonic circuits since the internal gain of photocurrent enables high sensitivity. However, state-of-t…

physics.app-ph2020★ 12 cited

Large-area femtosecond laser milling of silicon employing trench analysis

Arun Bhaskar, Justine Philippe, Flavie Braud +7

A femtosecond laser is a powerful tool for micromachining of silicon. In this work, large-area laser ablation of crystalline silicon is comprehensively studied using a laser source…

physics.app-ph2020★ 56 cited

28nm Fully-Depleted SOI Technology: Cryogenic Control Electronics for Quantum Computing

H. Bohuslavskyi, S. Barraud, M. Cassé +8

This paper reports the first cryogenic characterization of 28nm Fully-Depleted-SOI CMOS technology. A comprehensive study of digital/analog performances and body-biasing from room…

physics.app-ph2020★ 235 cited

Ultra-low threshold cw and pulsed lasing in tensile strained GeSn alloys

A. Elbaz, D. Buca, N. Von den Driesch +15

GeSn alloys are the most promising semiconductors for light emitters entirely based on group IV elements. Alloys containing more than 8 at.% Sn have fundamental direct band-gaps, s…

physics.app-ph2019★ 39 cited

Cryogenic characterization of 28nm FD-SOI ring oscillators with energy efficiency optimization

H. Bohuslavskyi, S. Barraud, V. Barral +14

Extensive electrical characterization of ring oscillators (ROs) made in high- metal gate 28nm Fully-Depleted Silicon-on- Insulator (FD-SOI) technology is presented for a set of…

physics.app-ph2018★ 15 cited

Measurement of anisotropic thermal conductivity of a dense forest of nanowires using the 3 method

Dhruv Singhal, Jessy Paterson, Dimitri Tainoff +7

The 3 method is a dynamic measurement technique developed for determining the thermal conductivity of thin films or semi-infinite bulk materials. A simplified model is often app…