activity
20032006
most citedImpurity Band Conduction in a High Temperature Ferromagnetic Semiconductor

174 citations · 369 across the 4 of their papers we have counts for

collaborators

10 papers

cond-mat.mes-hall200695 cited

Non-diffusive spin dynamics in a two-dimensional electron gas

C. P. Weber, J. Orenstein, B. Andrei Bernevig +3

We describe measurements of spin dynamics in the two-dimensional electron gas in GaAs/GaAlAs quantum wells. Optical techniques, including transient spin-grating spectroscopy, are u…

cond-mat.mes-hall200623 cited

Mechanical control of spin-orbit splitting in GaAs and InGaAs epilayers

V. Sih, H. Knotz, J. Stephens +3

Time-resolved Kerr rotation spectroscopy as a function of pump-probe distance, voltage and magnetic field is used to measure the momentum-dependent spin splitting energies in GaAs…

cond-mat.str-el2006174 cited

Impurity Band Conduction in a High Temperature Ferromagnetic Semiconductor

K. S. Burch, D. B. Shrekenhamer, E. J. Singley +7

The band structure of a prototypical dilute ferromagnetic semiconductor, GaMnAs, is studied across the phase diagram via optical spectroscopy. We prove that the Fermi…

cond-mat.mes-hall2005

Observation of spin Coulomb drag in a two-dimensional electron gas

C. P. Weber, N. Gedik, J. E. Moore +3

An electron propagating through a solid carries spin angular momentum in addition to its mass and charge. Of late there has been considerable interest in developing electronic devi…

cond-mat.mtrl-sci2005

Spatial Imaging and Mechanical Control of Spin Coherence in Strained GaAs Epilayers

H. Knotz, A. W. Holleitner, J. Stephens +2

The effect of uniaxial tensile strain on spin coherence in n-type GaAs epilayers is probed using time-resolved Kerr rotation, photoluminescence, and optically-detected nuclear magn…

cond-mat.mtrl-sci200477 cited

Ellipsometric study of the Electronic Structure of GaMnAs and LT-GaAs

K. S. Burch, J. Stephens, R. K. Kawakami +2

We have measured the optical constants of GaMnAs from 0.62 eV to 6 eV, using spectroscopic ellipsometry. The second derivatives of the dielectric function are examined through a cr…