most citedQuantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers

82 citations · 82 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2013★ 82 cited

Quantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers

Vinod K. Sangwan, Deep Jariwala, Stephen A. Filippone +6

The full potential of graphene in integrated circuits can only be realized with a reliable ultra-thin high-κ top-gate dielectric. Here, we report the first statistical analysis of…