activity
20182025
most citedCompact modeling technology for the simulation of integrated circuits based on graphene field-effect transistors

42 citations · 194 across the 15 of their papers we have counts for

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Showing cond-mat.mes-hallShow all

10 papers · 1 filter

cond-mat.mes-hall2025

An extended low-frequency noise compact model for single-layer graphene FETs including correlated mobility fluctuations effect

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, David Jimenez

Correlated mobility fluctuations are considered in the physics-based carrier number fluctuation deltaN low-frequency noise (LFN) compact model of single-layer graphene field effect…

cond-mat.mes-hall2025★ 3 cited

Physics-Based Compact Modeling for the Drain Current Variability in Single-Layer Graphene FETs

N. Mavredakis, A. Pacheco-Sanchez, R. Garcia Cortadella +3

For the growth of emerging graphene field-effect transistor (GFET) technologies, a thorough characterization of on-wafer variability is required. Here, we report for the first time…

cond-mat.mes-hall2023★ 5 cited

Physics-based bias-dependent compact modeling of 1/f noise in single- to few- layer 2D-FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Md Hasibul Alam +5

1/f noise is a critical figure of merit for the performance of transistors and circuits. For two-dimensional devices (2D-FETs), and especially for applications in the GHz range whe…

cond-mat.mes-hall2023★ 7 cited

Straightforward Bias and Frequency Dependent Small-Signal Model Extraction for Single-Layer Graphene FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Wei Wei +3

We propose an explicit small-signal graphene field-effect transistor (GFET) parameter extraction procedure based on a charge-based quasi-static model. The dependence of the small-s…

cond-mat.mes-hall2022★ 18 cited

An extraction method for mobility degradation and contact resistance of graphene transistors

Anibal Pacheco-Sanchez, Nikolaos Mavredakis, Pedro C. Feijoo +1

The intrinsic mobility degradation coefficient, contact resistance and the transconductance parameter of graphene field-effect transistors (GFETs) are extracted for different techn…

cond-mat.mes-hall2021★ 1 cited

Bias-dependent intrinsic RF thermal noise modeling and characterization of single layer graphene FETs

Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Paulius Sakalas +4

In this article, the bias-dependence of intrinsic channel thermal noise of single-layer graphene field-effect transistors (GFETs) is thoroughly investigated by experimental observa…

cond-mat.mes-hall2020★ 14 cited

Charge-Based Compact Model for Bias-Dependent Variability of 1/f Noise in MOSFETs

Nikolaos Mavredakis, Nikolaos Makris, Predrag Habas +1

Variability of low frequency noise (LFN) in MOSFETs is bias-dependent. Moderate- to large-sized transistors commonly used in analog/RF applications show 1/f-like noise spectra, res…

cond-mat.mes-hall2020★ 23 cited

Experimental observation and modeling of the impact of traps on static and analog/HF performance of graphene transistors

Anibal Pacheco-Sanchez, Nikolaos Mavredakis, Pedro C. Feijoo +4

The trap-induced hysteresis on the performance of a graphene field-effect transistor is experimentally diminished here by applying consecutive gate-to-source voltage pulses of oppo…

cond-mat.mes-hall2019★ 20 cited

Velocity Saturation effect on Low Frequency Noise in short channel Single Layer Graphene FETs

Nikolaos Mavredakis, Wei Wei, Emiliano Pallecchi +6

Graphene devices for analog and RF applications are prone to Low Frequency Noise (LFN) due to its upconversion to undesired phase noise at higher frequencies. Such applications dem…

cond-mat.mes-hall2018★ 29 cited

Understanding the Bias Dependence of Low Frequency Noise in Sin-gle Layer Graphene FETs

Nikolaos Mavredakis, Ramon Garcia Cortadella, Andrea Bonaccini Calia +2

This letter investigates the bias-dependent low frequency noise of single layer graphene field-effect transistors. Noise measurements have been conducted with electrolyte-gated gra…