4 MV/cm (010) $\beta$-Ga${}_2$O${}_3$ Heterojunction Diodes Realized by Low-Damage e-Beam NiO${}_x$ Interlayers

Abstract

We report on the utilization of a low-damage e-beam NiO${}_x$ deposition process to realize field-plated heterojunction diodes (FP-HJDs) on (010) $\beta$-Ga${}_2$O${}_3$ films with high critical breakdown field strengths beyond 4 MV/cm and power figure of merits (PFOM) of >1 GW/cm${}^2$. Diodes were fabricated on a 2.67 $\times$ 10${}^{16}$ cm${}^{-3}$ intentionally doped 6.2 $\mu$m thick epitaxial layer grown by metalorganic chemical vapor deposition (MOCVD) on a conductive Sn-doped $\beta$-Ga${}_2$O${}_3$ (010) substrate using TMGa, O${}_2$, Ar carrier gas, and SiH${}_4$ as the silicon dopant source. The mesa etched FP-HJD devices utilized a thin 7 nm e-beam NiO${}_x$ interlayer before the sputtered NiO${}_x$ layers to eliminate the effects of sputter-induced ion damage on the (010) epilayers. Current-Voltage measurements resulted in a forward current density of 700 A/cm${}^2$ at 4 V, HJD ideality factor of 1.29, a V${}_{bi}$ of 2 V, rectification ratio of 10${}^{11}$, and a differential specific on resistance (R${}_{on,sp}$) value of 2.36 m$\Omega$ $\times$ cm${}^2$. Breakdown of the (010) FP-HJDs was 1.64 kV, leading to a parallel plane electric field at breakdown (E${}_{||,max}$) of 4.02 MV/cm and a PFOM of 1.14 GW/cm${}^2$, which is a state-of-the-art result for diodes on MOCVD-grown (010) drift layers.

19 pages, 7 figures