Monitoring the formation of nanowires by line-of-sight quadrupole mass spectrometry: a comprehensive description of the temporal evolution of GaN nanowire ensembles
arXiv:2402.01757 · doi:10.1021/nl504778s
Abstract
We use line-of-sight quadrupole mass spectrometry to monitor the spontaneous formation of GaN nanowires on Si during molecular beam epitaxy. We find that the temporal evolution of nanowire ensembles is well described by a double logistic function. The analysis of the temporal evolution of nanowire ensembles prepared under a wide variety of growth conditions allows us to construct a growth diagram which can be used to predict the average delay time that precedes nanowire formation.
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- High-temperature growth of GaN nanowires by molecular beam epitaxy: toward the materials quality of bulk GaN
- Top-down fabrication of ordered arrays of GaN nanowires by selective area sublimation
- Improved control over spontaneously formed GaN nanowires in molecular beam epitaxy using a two-step growth process
- Elastic vs. plastic strain relaxation in coalesced GaN nanowires: an x-ray diffraction study
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- Absence of quantum-confined Stark effect in GaN quantum disks embedded in (Al,Ga)N nanowires grown by molecular beam epitaxy
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- Analysis of incubation time preceding the Ga-assisted nucleation and growth of GaAs nanowires on Si(111)
- Density control of GaN nanowires at the wafer scale using self-assembled SiN patches on sputtered TiN(111)
- Sequential directional deposition of one-sided (In,Ga)N shells on GaN nanowires by molecular beam epitaxy