Elastic vs. plastic strain relaxation in coalesced GaN nanowires: an x-ray diffraction study
arXiv:1608.07420 · doi:10.1103/PhysRevApplied.6.064023
Abstract
The coalescence in dense arrays of spontaneously formed GaN nanowires proceeds by bundling: adjacent nanowires bend and merge at their top, thus reducing their surface energy at the expense of the elastic energy of bending. We give a theoretical description of the energetics of this bundling process. The bending energy is shown to be substantially reduced by the creation of dislocations at the coalescence joints. A comparison of experimental and calculated x-ray diffraction profiles from ensembles of bundled nanowires demonstrates that a large part of the bending energy is indeed relaxed by plastic deformation. The residual bending manifests itself by extended tails of the diffraction profiles.
References in corpus (5)
- A growth diagram for plasma-assisted molecular beam epitaxy of GaN nanocolumns on Si(111)
- Self-regulated radius of spontaneously formed GaN nanowires in molecular beam epitaxy
- Monitoring the formation of nanowires by line-of-sight quadrupole mass spectrometry: a comprehensive description of the temporal evolution of GaN nanowire ensembles
- Correlation between the structural and optical properties of spontaneously formed GaN nanowires: a quantitative evaluation of the impact of nanowire coalescence
- Long-lived excitons in GaN/AlN nanowire heterostructures