Fabrication and surface treatment of electron-beam evaporated niobium for low-loss coplanar waveguide resonators
arXiv:2108.05354 · doi:10.1063/5.0066441
Abstract
We characterize low-loss electron-beam evaporated niobium thin films deposited under ultra-high vacuum conditions. Slow deposition yields films with a high superconducting transition temperature () as well as a residual resistivity ratio of . We fabricate the films into coplanar waveguide resonators to extract the intrinsic loss due to the presence of two-level-system fluctuators using microwave measurements. For a coplanar waveguide resonator gap of , the films exhibit filling-factor-adjusted two-level-system loss tangents as low as with single-photon regime internal quality factors in excess of one million after removing native surface oxides of the niobium.
5 pages, 3 figures
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