Time-domain response of atomically thin nanomechanical resonators
arXiv:1405.5666 · doi:10.1063/1.4892072
Abstract
We measure the energy relaxation rate of single- and few-layer molybdenum disulphide () nanomechanical resonators by detecting the resonator ring-down. Recent experiments on these devices show a remarkably low quality (Q)-factor when taking spectrum measurements at room temperature. The origin of the low spectral Q-factor is an open question, and it has been proposed that besides dissipative processes, frequency fluctuations contribute significantly to the resonance line-width. The spectral measurements performed thus far however, do not allow one to distinguish these two processes. Here, we use time-domain measurements to quantify the dissipation. We compare the Q-factor obtained from the ring-down measurements to those obtained from the thermal noise spectrum and from the frequency response of the driven device. In few-layer and single-layer resonators the two are in close agreement, which demonstrates that the spectral line-width in membranes at room temperature is limited by dissipation, and that excess spectral broadening plays a negligible role.
13 pages, 5 figures
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- Dynamics of 2D Material Membranes
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- Diffusion-induced dissipation and mode coupling in nanomechanical resonators
- Mechanical mode imaging of a high-Q hybrid hBN/SiN resonator