A direct comparison of CVD-grown and exfoliated MoS2 using optical spectroscopy
arXiv:1310.8470 · doi:10.1088/0268-1242/29/6/064008
Abstract
MoS2 is a highly interesting material system, which exhibits a crossover from an indirect band gap in the bulk crystal to a direct gap for single layers. Here, we perform a direct comparison between large-area MoS films grown by chemical vapor deposition (CVD) and MoS flakes prepared by mechanical exfoliation from natural bulk crystal. Raman spectroscopy measurements show differences between the in-plane and out-of-plane phonon mode positions in CVD-grown and exfoliated MoS. Photoluminescence (PL) mapping reveals large regions in the CVD-grown films that emit strong PL at room temperature, and low-temperature PL scans demonstrate a large spectral shift of the A exciton emission as a function of position. Polarization-resolved PL measurements under near-resonant excitation conditions show a strong circular polarization of the PL, corresponding to a valley polarization.
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