Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law-Johnson-noise secure key exchange
arXiv:1309.2179 · doi:10.1007/s10825-013-0515-2
Abstract
We classify and analyze bit errors in the current measurement mode of the Kirchhoff-law-Johnson-noise (KLJN) key distribution. The error probability decays exponentially with increasing bit exchange period and fixed bandwidth, which is similar to the error probability decay in the voltage measurement mode. We also analyze the combination of voltage and current modes for error removal. In this combination method, the error probability is still an exponential function that decays with the duration of the bit exchange period, but it has superior fidelity to the former schemes.
9 pages, accepted for publication in Journal of Computational Electronics
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- Communication by Means of Thermal Noise: Towards Networks with Extremely Low Power Consumption
- Elimination of a Second-Law-attack, and all cable-resistance-based attacks, in the Kirchhoff-law-Johnson-noise (KLJN) secure key exchange system
- Random-resistor-random-temperature Kirchhoff-law-Johnson-noise (RRRT-KLJN) key exchange
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- Deterministic Random Number Generator Attack against the Kirchhoff-Law-Johnson-Noise Secure Key Exchange Protocol
- AC Loop Current Attacks Against The KLJN Secure Key Exchange Scheme
- Perspective -- On the thermodynamics of perfect unconditional security
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- Facts, myths and fights about the KLJN classical physical key exchanger