Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains

Abstract

We report on a systematic study of the stress transferred from an electromechanical piezo-stack into GaAs wafers under a wide variety of experimental conditions. We show that the strains in the semiconductor lattice, which were monitored in situ by means of X-ray diffraction, are strongly dependent on both the wafer thickness and on the selection of the glue which is used to bond the wafer to the piezoelectric actuator. We have identified an optimal set of parameters that reproducibly transfers the largest distortions at room temperature. We have studied strains produced not only by the frequently used uniaxial piezostressors but also by the biaxial ones which replicate the routinely performed experiments using substrate-induced strains but with the advantage of a continuously tunable lattice distortion. The time evolution of the strain response and the sample tilting and/or bending are also analyzed and discussed.

8 pages, 4 figures

References in corpus (7)

• Divergent nematic susceptibility in an iron arsenide superconductor
• Experimental observation of the optical spin transfer torque
• GaMnAs-based hybrid multiferroic memory device
• Voltage control of magnetocrystalline anisotropy in ferromagnetic - semiconductor/piezoelectric hybrid structures
• Low-temperature, in situ tunable, uniaxial stress measurements in semiconductors using a piezoelectric actuator
• Piezoelectric strain induced variation of the magnetic anisotropy in a high Curie temperature (Ga,Mn)As sample
• Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains

Cited by in corpus (5)

• Ubiquitous signatures of nematic quantum criticality in optimally doped Fe-based superconductors
• Effect of disorder on the resistivity anisotropy near the electronic nematic phase transition in pure and electron-doped BaFe${}_2$As${}_2$
• Measurement of the $B_{1g}$ and $B_{2g}$ components of the elastoresistivity tensor for tetragonal materials via transverse resistivity configurations
• Voigt effect-based wide-field magneto-optical microscope integrated in a pump-probe experimental setup
• Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains