Electron Transport in InAs-InAlAs Core-Shell Nanowires
arXiv:1209.2767 · doi:10.1063/1.4788742
Abstract
Evidence is given for the effectiveness of InAs surface passivation by the growth of an epitaxial InAlAs shell. The electron mobility is measured as a function of temperature for both core-shell and unpassivated nanowires, with the core-shell nanowires showing a monotonic increase in mobility as temperature is lowered, in contrast to a turnover in mobility seen for the unpassivated nanowires. We argue that this signifies a reduction in low temperature ionized impurity scattering for the passivated nanowires, implying a reduction in surface states.
12 pages, 4 figures; newest version has reference numbers corrected
References in corpus (4)
Cited by in corpus (6)
- Mobility Enhancement by Sb-mediated Minimisation of Stacking Fault Density in InAs Nanowires Grown on Silicon
- Temperature-dependent electron mobility in InAs nanowires
- Nb/InAs nanowire proximity junctions from Josephson to quantum dot regimes
- InAs nanowire with epitaxial aluminium as a single-electron transistor with fixed tunnel barriers
- Electrical characterization of chemical and dielectric passivation of InAs nanowires
- Magnetoconductance signatures of subband structure in semiconductor nanowires