Well-width dependence of valley splitting in Si/SiGe quantum wells
arXiv:0911.1847 · doi:10.1063/1.3270539
Abstract
The valley splitting in Si two-dimensional electron systems is studied using Si/SiGe single quantum wells (QWs) with different well widths. The energy gaps for 4 and 5.3 nm QWs, obtained from the temperature dependence of the longitudinal resistivity at the Landau level filling factor , are much larger than those for 10 and 20 nm QWs. This is consistent with the well-width dependence of the bare valley splitting estimated from the comparison with the Zeeman splitting in the Shubnikov-de Haas oscillations.
3 pages, 2 figures
References in corpus (2)
Cited by in corpus (6)
- Resonant tunnelling features in the transport spectroscopy of quantum dots
- Detuning Axis Pulsed Spectroscopy of Valley-Orbital States in Si/SiGe Quantum Dots
- Coherent spin-valley oscillations in silicon
- Spin-Blockade Spectroscopy of Si/SiGe Quantum Dots
- Effects of Interface Disorder on Valley Splitting in SiGe/Si/SiGe Quantum Wells
- Effect of quantum Hall edge strips on valley splitting in silicon quantum wells