3 papers
cond-mat.dis-nn2004
Resistance Noise Near to Electrical Breakdown: Steady State of Random Networks as a Function of the Bias
Cecilia Pennetta
A short review is presented of a recently developed computational approach which allows the study of the resistance noise over the full range of bias values, from the linear regime…
cond-mat.stat-mech2002
Linear and nonlinear regime of a Random Resistor Network under biased percolation
C. Pennetta, E. Alfinito, L. Reggiani
We investigate the steady state of a two-dimensional random resistor network subjected to two competing biased percolations as a function of the bias strength. The properties of th…
cond-mat2001
Monte Carlo simulation of electromigration phenomena in metallic lines
C. Pennetta, L. Reggiani, E. Alfinito
The electromigration (EM) of metallic lines is studied in terms of competition between two percolative processes taking place in a random resistor network. The effects associated w…