Non-Gaussianity of resistance fluctuations near electrical breakdown

Abstract

We study the resistance fluctuation distribution of a thin film near electrical breakdown. The film is modeled as a stationary resistor networkunder biased percolation. Depending on the value of the external current,on the system sizes and on the level of internal disorder, the fluctuation distribution can exhibit a non-Gaussian behavior. We analyze this non-Gaussianity in terms of the generalized Gumbel distribution recently introduced in the context of highly correlated systems near criticality. We find that when the average fraction of defects approaches the random percolation threshold, the resistance fluctuation distribution is well described by the universal behavior of the Bramwell-Holdsworth-Pinton distribution.

arXiv comment3 figures, accepted for publication on Semicond Sci Tech

References in corpus (4)

• Universal Fluctuations in Correlated Systems
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• Roughness distributions for 1/f^alpha signals
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• Non-Gaussian Resistance Noise near Electrical Breakdown in Granular Materials
• Temperature dependent fluctuations in the two-dimensional XY model
• Tuning the Correlation Decay in the Resistance Fluctuations of Multi-Species Networks
• Non-Gaussian Fluctuations in Biased Resistor Networks: Size Effects versus Universal Behavior