Non-Gaussian Resistance Noise near Electrical Breakdown in Granular Materials

Abstract

The distribution of resistance fluctuations of conducting thin films with granular structure near electrical breakdown is studied by numerical simulations. The film is modeled as a resistor network in a steady state determined by the competition between two biased processes, breaking and recovery. Systems of different sizes and with different levels of internal disorder are considered. Sharp deviations from a Gaussian distribution are found near breakdown and the effect increases with the degree of internal disorder. However, we show that in general this non-Gaussianity is related to the finite size of the system and vanishes in the large size limit. Nevertheless, near the critical point of the conductor-insulator transition, deviations from Gaussianity persist when the size is increased and the distribution of resistance fluctuations is well fitted by the universal Bramwell-Holdsworth-Pinton distribution.

arXiv comment8 pages, 6 figures; accepted for publication on Physica A

References in corpus (9)

• First-Order Transition in the Breakdown of Disordered Media
• Universal Fluctuations in Correlated Systems
• Tri-critical behavior in rupture induced by disorder
• 1/f Noise and Extreme Value Statistics
• Magnetic fluctuations in the classical XY model: the origin of an exponential tail in a complex system
• Roughness distributions for 1/f^alpha signals
• Universal Magnetic Fluctuations with a Field Induced Length Scale
• Resistance and Resistance Fluctuations in Random Resistor Networks Under Biased Percolation
• Non-Gaussianity of resistance fluctuations near electrical breakdown

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• Charge transport and current fluctuations in bacteriorhodopsin based nanodevices
• Non-Gaussian Fluctuations in Biased Resistor Networks: Size Effects versus Universal Behavior
• Statistics of Extreme Values in Time Series with Intermediate-Term Correlations