Trapping-detrapping fluctuations in organic space-charge layers

Abstract

A trapping-detrapping model is proposed for explaining the current fluctuation behavior in organic semiconductors (polyacenes) operating under current-injection conditions. The fraction of ionized traps obtained from the current-voltage characteristics, is related to the relative current noise spectral density at the trap-filling transition. The agreement between theory and experiments validates the model and provides an estimate of the concentration and energy level of deep traps.

References in corpus (5)

• Space-Charge-Limited Current Fluctuations in Organic Semiconductors
• Space Charge Limited Transport and Time of Flight Measurements in Tetracene Single Crystals: a Comparative Study
• Bias-Dependent Generation and Quenching of Defects in Pentacene
• $f^{-\gamma }$ Current Fluctuations in Organic Semiconductors: Evidence for Percolation
• Tuning the Correlation Decay in the Resistance Fluctuations of Multi-Species Networks

Cited by in corpus (2)

• Quantum theory of space charge limited current in solids
• An analysis of carrier dynamics in methylammonium lead triiodide perovskite solar cells using cross-correlation noise spectroscopy