172 citations · 640 across the 16 of their papers we have counts for
16 papers
Spatially resolved dielectric loss at the Si/SiO interface
Megan Cowie, Taylor J. Z. Stock, Procopios C. Constantinou +2
The Si/SiO interface is populated by isolated trap states which modify its electronic properties. These traps are of critical interest for the development of semiconductor-base…
Charge carrier inversion in a doped thin film organic semiconductor island
Zeno Schumacher, Rasa Rejali, Megan Cowie +3
Inducing an inversion layer in organic semiconductors is a highly nontrivial, but critical, achievement for producing organic field-effect transistor (OFET) devices, which rely on…
Growth and Elasticity of Mechanically-Created Neurites
Madeleine Anthonisen, Peter Grutter
Working in the framework of morphoelasticity, we develop a model of neurite growth in response to elastic deformation. We decompose the applied stretch into an elastic component an…
Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil +4
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical re…
Nanopore fabrication via tip-controlled local breakdown using an atomic force microscope
Yuning Zhang, Yoichi Miyahara, Nassim Derriche +5
The dielectric breakdown approach for forming nanopores has greatly accelerated the pace of research in solid-state nanopore sensing, enabling inexpensive formation of nanopores vi…
Dissipation modulated Kelvin probe force microscopy method
Yoichi Miyahara, Peter Grutter
We review a new implementation of Kelvin probe force microscopy (KPFM) in which the dissipation signal of frequency modulation atomic force microscopy (FM-AFM) is used for dc bias…