Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
arXiv:1703.00033 · doi:10.1063/1.4981937
Abstract
We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force. It features a simple implementation and faster scanning as it requires no low frequency modulation. We show that applying a coherent ac voltage with two times the cantilever oscillation frequency induces the dissipation signal proportional to the electrostatic force gradient which depends on the effective dc bias voltage including the contact potential difference. We demonstrate the KPFM images of a MoS flake taken with the present method is in quantitative agreement with that taken with the frequency modulated Kelvin probe force microscopy technique.
4 pages, 4 figures, supplemental materials. arXiv admin note: text overlap with arXiv:1508.05866
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