119 citations · 502 across the 20 of their papers we have counts for
20 papers
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park +5
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron char…
Electrostatic moiré potential from twisted-hBN layers
Dong Seob Kim, Roy C. Dominguez, Rigo Mayorga-Luna +17
Moiré superlattices formed by vertically stacking van der Waals layers host a rich variety of correlated electronic phases and function as novel photonic materials. The moiré poten…
Charge carrier inversion in a doped thin film organic semiconductor island
Zeno Schumacher, Rasa Rejali, Megan Cowie +3
Inducing an inversion layer in organic semiconductors is a highly nontrivial, but critical, achievement for producing organic field-effect transistor (OFET) devices, which rely on…
Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil +4
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical re…
Nanopore fabrication via tip-controlled local breakdown using an atomic force microscope
Yuning Zhang, Yoichi Miyahara, Nassim Derriche +5
The dielectric breakdown approach for forming nanopores has greatly accelerated the pace of research in solid-state nanopore sensing, enabling inexpensive formation of nanopores vi…
Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +2
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample intera…