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cond-mat.mes-hall2017
Dissipation modulated Kelvin probe force microscopy method
Yoichi Miyahara, Peter Grutter
We review a new implementation of Kelvin probe force microscopy (KPFM) in which the dissipation signal of frequency modulation atomic force microscopy (FM-AFM) is used for dc bias…
cond-mat.mes-hall2017★ 16 cited
Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
Yoichi Miyahara, Peter Grutter
We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the grad…