Quantum state readout of individual quantum dots by electrostatic force detection

Abstract

Electric charge detection by atomic force microscopy (AFM) with single- electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual quantum dots (QD). The oscillating AFM tip modulates the energy of the QDs, causing single electrons to tunnel between QDs and an electrode. The resulting oscillating electrostatic force changes the resonant frequency and damping of the AFM cantilever, enabling electrometry with a single-electron sensitivity. Quantitative electronic level spectroscopy is possible by sweeping the bias voltage. Charge stability diagram can be obtained by scanning the AFM tip around the QD. e-EFM technique enables to investigate individual colloidal nanoparticles and self- assembled QDs without nanoscale electrodes. e-EFM is a quantum electromechanical system where the back-action of a tunneling electron is detected by AFM; it can also be considered as a mechanical analog of admittance spectroscopy with a radio frequency resonator, which is emerging as a promising tool for quantum state readout for quantum computing. In combination with the topography imaging capability of the AFM, e-EFM is a powerful tool for investigating new nanoscale material systems which can be used as quantum bits.

arXiv comment28 pages, 17 figures

References in corpus (29)

• Spins in few-electron quantum dots
• Electron transport through double quantum dots
• Single-shot read-out of an individual electron spin in a quantum dot
• Circuit Quantum Electrodynamics with a Spin Qubit
• Spectroscopy of discrete energy levels in ultrasmall metallic grains
• Charge-qubit operation of an isolated double quantum dot
• Dipole coupling of a double quantum dot to a microwave resonator
• Franck-Condon blockade in suspended carbon nanotube quantum dots
• Transport spectroscopy of a single dopant in a gated silicon nanowire
• Dispersive Readout of a Few-Electron Double Quantum Dot with Fast rf Gate-Sensors
• A high-sensitivity gate-based charge sensor in silicon
• Charge and spin state readout of a double quantum dot coupled to a resonator
• Solving rate equations for electron tunneling via discrete quantum states
• Detection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy
• Spatially resolved manipulation of single electrons in quantum dots using a scanned probe
• Quantum nano-electromechanics with electrons, quasiparticles and Cooper pairs: effective bath descriptions and strong feedback effects
• Energy levels of few electron quantum dots imaged and characterized by atomic force microscopy
• Damping of a nanomechanical oscillator strongly coupled to a quantum dot
• Measurement of discrete energy-level spectra in individual chemically-synthesized gold nanoparticles
• Measuring the complex admittance of a carbon nanotube double quantum dot
• Gate-sensing coherent charge oscillations in a silicon field-effect transistor
• Resonant tunnelling features in the transport spectroscopy of quantum dots
• Transport in single-molecule transistors: Kondo physics and negative differential resistance
• Fast detection of single-charge tunneling to a graphene quantum dot in a multi-level regime
• Radio frequency reflectometry and charge sensing of a precision placed donor in silicon
• Dynamical instabilities of a resonator driven by a superconducting single-electron transistor
• Radio-frequency dispersive detection of donor atoms in a field-effect transistor
• Defect detection in nano-scale transistors based on radio-frequency reflectometry
• Mechanically probing coherent tunnelling in a double quantum dot

Cited by in corpus (6)

• Controlling the magnetism of oxygen surface vacancies in strontium titanate $(\mathrm{SrTi}{\mathrm{O}}_3)$ through charging
• Microwave-frequency scanning gate microscopy of a Si/SiGe double quantum dot
• Unveiling non-Abelian statistics of vortex Majorana bound states in iron-based superconductors using fermionic modes
• Charge carrier inversion in a doped thin film organic semiconductor island
• Lagrangian and impedance spectroscopy treatments of electric force microscopy
• Spectroscopy of van der Waals nanomaterials: Opportunities and Challenges