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20052023
most citedDetection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy

119 citations · 120 across the 3 of their papers we have counts for

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cond-mat.mtrl-sci2023

Spatially resolved dielectric loss at the Si/SiO interface

Megan Cowie, Taylor J. Z. Stock, Procopios C. Constantinou +2

The Si/SiO interface is populated by isolated trap states which modify its electronic properties. These traps are of critical interest for the development of semiconductor-base…