172 citations · 640 across the 16 of their papers we have counts for
4 papers · 1 filter
Spatially resolved dielectric loss at the Si/SiO interface
Megan Cowie, Taylor J. Z. Stock, Procopios C. Constantinou +2
The Si/SiO interface is populated by isolated trap states which modify its electronic properties. These traps are of critical interest for the development of semiconductor-base…
FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion
William Paul, David Oliver, Yoichi Miyahara +1
Atoms transferred to W(111) and W(110) tip apices from the Au(111) surface during tunneling and approach to mechanical contact experiments in STM are characterized in FIM at room t…
Detection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy
Romain Stomp, Yoichi Miyahara, Sacha Schaer +6
Single electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic force microscope (AFM). The resonant frequency shift and…
Surface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopy
W. A. Hofer, A. J. Fisher, R. A. Wolkow +1
We have performed the most realistic simulation to date of the operation of a scanning tunneling microscope. Probe-sample distances from beyond tunneling to actual surface contact…