170 citations · 352 across the 7 of their papers we have counts for
3 papers · 1 filter
Near-Field Microwave Microscopy on nanometer length scales
Atif Imtiaz, Marc Pollak, Steven M Anlage +2
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample inter…
A novel Microwave Frequency Scanning Capacitance Microscope
Atif Imtiaz, Steven M. Anlage
We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm ab…
Near-Field Microwave Microscopy of Materials Properties
Steven M. Anlage, D. E. Steinhauer, B. J. Feenstra +2
Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics,…