279 citations · 5.3k across the 143 of their papers we have counts for
18 papers · 1 filter
Switching nonlinearity in a superconductor-enhanced metamaterial
Cihan Kurter, Philippe Tassin, Alexander P. Zhuravel +5
We demonstrate a nonlinear metamaterial that can be switched between low and high transmission by controlling the power level of the incident beam. The origin of this nonlinear res…
Large group delay in a microwave metamaterial analogue of electromagnetically induced transparency
Lei Zhang, Philippe Tassin, Thomas Koschny +3
We report on our experimental work concerning a planar metamaterial exhibiting classical electromagnetically induced transparency (EIT). Using a structure with two mirrored split-r…
Frequency- and electric-field-dependent conductivity of single-walled carbon nanotube networks of varying density
Hua Xu, Liangbing Hu, Shixiong Zhang +2
We present measurements of the frequency and electric field dependent conductivity of single walled carbon nanotube(SWCNT) networks of various densities. The ac conductivity as a f…
Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope
Atif Imtiaz, Steven M. Anlage, John D. Barry +1
We report topography-free materials contrast imaging on a nano-fabricated Boron-doped Silicon sample measured with a Near-field Scanning Microwave Microscope over a broad frequency…
Broadband dielectric microwave microscopy on m length scales
Alexander Tselev, Steven M. Anlage, Zhengkun Ma +1
We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope pro…
Microwave shielding of transparent and conducting single-walled carbon nanotube films
Hua Xu, Liangbing Hu, Steven M. Anlage +1
The authors measured the transport properties of single-walled carbon nanotube (SWCNT) films in the microwave frequency range from 10 MHz to 30 GHz by using the Corbino reflection…
Local Dielectric Measurements of BaTiO3-CoFe2O4 Nano-composites Through Microwave Microscopy
Yi Qi, H. Zheng, R. Ramesh +1
We report on linear and non-linear dielectric property measurements of BaTiO3 - CoFe2O4 (BTO-CFO) ferroelectro-magnetic nano-composites and pure BaTiO3 and CoFe2O4 samples with Sca…
Effect of tip-geometry on contrast and spatial-resolution of the Near-Field Microwave Microscope
Atif Imtiaz, Steven M. Anlage
The Near-Field Scanning Microwave Microscope (NSMM) can quantitatively image materials properties at length scales far shorter than the free space wavelength (λ). Here we report a…
Near-Field Microwave Microscopy on nanometer length scales
Atif Imtiaz, Marc Pollak, Steven M Anlage +2
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample inter…
Evidence for power-law frequency dependence of intrinsic dielectric response in the CaCuTiO
Alexander Tselev, Charles M. Brooks, Haimei Zheng +4
We investigated the dielectric response of CaCuTiO (CCTO) thin films grown epitaxially on LaAlO (001) substrates by Pulsed Laser Deposition (PLD). The dielectric…
A novel Microwave Frequency Scanning Capacitance Microscope
Atif Imtiaz, Steven M. Anlage
We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm ab…
Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope
D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood +5
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 mic…
Near-Field Microwave Microscopy of Materials Properties
Steven M. Anlage, D. E. Steinhauer, B. J. Feenstra +2
Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics,…
Imaging of Microwave Permittivity, Tunability, and Damage Recovery in (Ba,Sr)TiO3 Thin Films
D. E. Steinhauer, C. P. Vlahacos, C. Canedy +5
We describe the use of a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film dielectric samples on a length sca…
Measurement of Resonant Frequency and Quality Factor of Microwave Resonators: Comparison of Methods
Paul J. Petersan, Steven M. Anlage
Precise microwave measurements of sample conductivity, dielectric, and magnetic properties are routinely performed with cavity perturbation measurements. These methods require the…
Quantitative topographic imaging using a near-field scanning microwave microscope
C. P. Vlahacos, D. E. Steinhauer, S. K. Dutta +3
We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system's resonant frequency, we obta…
Quantitative Imaging of Sheet Resistance with a Scanning Near-Field Microwave Microscope
D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta +3
We describe quantitative imaging of the sheet resistance of metallic thin films by monitoring frequency shift and quality factor in a resonant scanning near-field microwave microsc…
Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope
D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta +2
We describe near-field imaging of sample sheet resistance via frequency shifts in a resonant coaxial scanning microwave microscope. The frequency shifts are related to local sample…