26 citations · 365 across the 56 of their papers we have counts for
Showing 2013 · cond-mat.mtrl-sciShow all
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cond-mat.mtrl-sci2013
Application of Scanning Mid-IR-Laser Microscopy for Characterization of Semiconductor Materials for Photovoltaics
V. P. Kalinushkin, O. V. Astafiev, V. A. Yuryev
The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfu…
cond-mat.mtrl-sci2013
Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy
A. G. Touryanski, V. M. Senkov, S. S. Gizha +7
Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented
cond-mat.mtrl-sci2013★ 11 cited
Metal silicide/poly-Si Schottky diodes for uncooled microbolometers
K. V. Chizh, V. A. Chapnin, V. P. Kalinushkin +3
Nickel silicide Schottky diodes formed on polycrystalline Si<P> films are proposed as temperature sensors of monolithic uncooled microbolometer IR focal plane arrays. Structure and…