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Extended defects as a source of phonon confinement in polycrystalline Si and Ge films
Larisa V. Arapkina, Kirill V. Chizh, Oleg V. Uvarov +9
We present Raman spectroscopy of the polycrystalline Si and Ge films deposited by molecular beam deposition on a dielectric substrate. The Raman study has been made using lasers wi…
Evolution of Ge wetting layers growing on smooth and rough Si (001) surfaces: isolated {105} facets as a kinetic factor of stress relaxation
Larisa V. Arapkina, Kirill V. Chizh, Vladimir P. Dubkov +2
The results of STM and RHEED studies of a thin Ge film grown on the Si/Si(001) epitaxial layers with different surface relief are presented. Process of the partial stress relaxatio…
Thermal-fluctuation mechanism of long-term corrosion of glass caused by internal stress: processes of depolymerization, impurity migration and fracturing on an atomic scale
Irina F. Kadikova, Tatyana V. Yuryeva, Ekaterina A. Morozova +4
Long-term corrosion of glass is studied using polarising light microscopy, FTIR and SEM including EDX and elemental mapping. Early 19th century beads made of lead-potassium glass a…
Influence of the thickness of Si and Ge films deposited on SiN/SiO/Si substrates on their structure and diffusion of hydrogen atoms from SiN layers
Larisa V. Arapkina, Kirill V. Chizh, Dmitry B. Stavrovskii +5
The results of RHEED, FTIR and Raman spectroscopy study of silicon and germanium films with the thickness up to 200 nm grown from molecular beams on dielectric SiN/SiO/…
Peculiarities and evolution of Raman spectra of multilayer Ge/Si(001) heterostructures containing arrays of low-temperature MBE-grown Ge quantum dots of different size and number density: Experimental studies and numerical simulations
Mikhail S. Storozhevykh, Larisa V. Arapkina, Sergey M. Novikov +4
Ge/Si(001) multilayer heterostructures containing arrays of low-temperature self-assembled Ge quantum dots and very thin SiGe layers of varying composition and complex…
Diffusion processes in germanium and silicon films grown on SiN substrates
Larisa V. Arapkina, Kirill V. Chizh, Dmitry B. Stavrovskii +3
In this article, the results of investigation of processes occurring during the molecular-beam deposition of germanium layers on SiN dielectric substrates within a wide ran…