collaborators

1 paper

cond-mat.mtrl-sci2005

A near-field scanned microwave probe for spatially localized electrical metrology

Vladimir V. Talanov, Andre Scherz, Robert L. Moreland +1

We have developed a near-field scanned microwave probe with a sampling volume of approximately 10 micron in diameter, which is the smallest one achieved in near-field microwave mic…