Disentangling superconductor and dielectric microwave losses in sub-micron $\mathrm{Nb}$/$\mathrm{TEOS}-\mathrm{Si}{\mathrm{O}}_2$ interconnects using a multi-mode microstrip resonator

Cougar A. T. Garcia, Nancyjane Bailey, Chris Kirby +4

Understanding the origins of power loss in superconducting interconnects is essential for the energy efficiency and scalability of superconducting digital logic. At microwave frequ…