activity
20062017
most citedElectrical detection of 31P spin quantum states

149 citations · 327 across the 7 of their papers we have counts for

collaborators

7 papers

cond-mat.mes-hall2017★ 5 cited

Measurements and atomistic theory of electron factor anisotropy for phosphorus donors in strained silicon

M. Usman, H. Huebl, A. R. Stegner +3

This work reports the measurement of electron factor anisotropy ( = ) for phosphorous donor qubits in strained silicon (sSi = Si/Si$_{1-x}…

cond-mat.mtrl-sci2011★ 21 cited

Electrical detection of free induction decay and Hahn echoes in phosphorus doped silicon

Jinming Lu, Felix Hoehne, Andre R. Stegner +4

Paramagnetic centers in a solid-state environment usually give rise to inhomogenously broadened electron paramagnetic resonance (EPR) lines, making conventionally detected free ind…

cond-mat.mtrl-sci2010★ 25 cited

Isotope effect on electron paramagnetic resonance of boron acceptors in silicon

A. R. Stegner, H. Tezuka, T. Andlauer +4

The fourfold degeneracy of the boron acceptor ground state in silicon, which is easily lifted by any symmetry breaking perturbation, allows for a strong inhomogeneous broadening of…

cond-mat.mtrl-sci2010★ 28 cited

Electron Paramagnetic Resonance of Boron Acceptors in Isotopically Purified Silicon

H. Tezuka, A. R. Stegner, A. M. Tyryshkin +5

The electron paramagnetic resonance (EPR) linewidths of B acceptors in Si are found to reduce dramatically in isotopically purified 28Si single crystals. Moreover, extremely narrow…

quant-ph2007★ 63 cited

Electrical detection of spin echoes for phosphorus donors in silicon

Hans Huebl, Felix Hoehne, Benno Grolik +3

The electrical detection of spin echoes via echo tomography is used to observe decoherence processes associated with the electrical readout of the spin state of phosphorus donor el…

cond-mat.mtrl-sci2006★ 36 cited

Phosphorus donors in highly strained silicon

Hans Huebl, Andre R. Stegner, Martin Stutzmann +5

The hyperfine interaction of phosphorus donors in fully strained Si thin films grown on virtual SiGe substrates with is determined via electrically detected…