902 citations · 1k across the 15 of their papers we have counts for
17 papers
ePIC Early Science Report
D. Abbott, N. Abdelrahman, S. Abhijit +781
This Early Science Report from the ePIC Collaboration outlines the compelling physics program achievable during the first years of operation of the Electron-Ion Collider (EIC), pri…
Impact of front-end parameters of the ARCADIA MD3 on charged particle detection
C. Pantouvakis, S. Garbolino, M. Rignanese +21
The ARCADIA INFN R&D project developed a Fully Depleted Monolithic Active Pixel Sensor (FD-MAPS) using a customized LFoundry 110 nm CIS process. The first in-beam characterization…
Characterisation of the first wafer-scale prototype for the ALICE ITS3 upgrade: the monolithic stitched sensor (MOSS)
Omar Abdelrahman, Gianluca Aglieri Rinella, Luca Aglietta +136
This paper presents the characterisation and testing of the first wafer-scale monolithic stitched sensor (MOSS) prototype developed for the ALICE ITS3 upgrade that is to be install…
Input to the ESPPU: The LUXE Experiment
H. Abramowicz, M. Almanza Soto, M. Altarelli +130
This document presents an overview of LUXE (Laser Und XFEL Experiment), an experiment that will combine the high-quality and high-energy electron beam of the European XFEL with a h…
On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments
Saulo G. Alberton, Alexis C. V. Bôas, Jeffery Wyss +9
The vulnerability of prominent silicon-based U-shaped Metal-Oxide-Semiconductor Field Effect Transistors (UMOSFET) to destructive radiation effects when operating in terrestrial at…
Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…