Monolithic Pixel Sensors in Deep-Submicron SOI Technology

Abstract

Monolithic pixel sensors for charged particle detection and imaging applications have been designed and fabricated using commercially available, deep-submicron Silicon-On-Insulator (SOI) processes, which insulate a thin layer of integrated full CMOS electronics from a high-resistivity substrate by means of a buried oxide. The substrate is contacted from the electronics layer through vias etched in the buried oxide, allowing pixel implanting and reverse biasing. This paper summarizes the performances achieved with a first prototype manufactured in the OKI 0.15 micrometer FD-SOI process, featuring analog and digital pixels on a 10 micrometer pitch. The design and preliminary results on the analog section of a second prototype manufactured in the OKI 0.20 micrometer FD-SOI process are briefly discussed.

Proceedings of the PIXEL 2008 International Workshop, FNAL, Batavia, IL, 23-26 September 2008. Submitted to JINST - Journal of Instrumentation

References in corpus (3)

• A Study of Monolithic CMOS Pixel Sensors Back-thinning and their Application for a Pixel Beam Telescope
• A Monolithic Pixel Sensor in 0.15 micron Fully Depleted SOI Technology
• Tracking and Vertexing with a Thin CMOS Pixel Beam Telescope