most citedDeep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach

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cs.CV2022★ 1 cited

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach

Bappaditya Dey, Enrique Dehaerne, Kasem Khalil +3

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically obj…