33 citations · 112 across the 23 of their papers we have counts for
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eess.SP2026
Information-Theoretic Causal Modelling of Semiconductor Process Dynamics
Daniel Sørensen, Giorgio Melchiorre, Sudip Bandyopadhyay +3
With the progress of the semiconductor industry toward increasingly complex compute devices and tighter process tolerances, advanced process control has become crucial. This work e…
cs.CV2026
High-Fidelity Synthetic Transmission Electron Microscopy Image Generation Using Diffusion Probabilistic Models for Data-Limited Semiconductor Metrology
Johannes Boehm, Bappaditya Dey
Advanced semiconductor nodes drastically increased demand for Transmission Electron Microscopy (TEM), yet destructive sample preparation, slow imaging and high costs severely limit…