189 citations · 812 across the 21 of their papers we have counts for
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Dielectric Reliability and Interface Trap Characterization in MOCVD grown In-situ AlO on -GaO
Saurav Roy, Arkka Bhattacharyya, Carl Peterson +1
In this article, we investigate the in-situ growth of AlO on -GaO using metal-organic chemical vapor deposition (MOCVD) at a high temperature of 800°C. The Al$_2…
Enhancing the Electron Mobility in Si-doped (010) -GaO films with Low-Temperature Buffer Layers
Arkka Bhattacharyya, Carl Peterson, Takeki Itoh +6
We demonstrate a new substrate cleaning and buffer growth scheme in -GaO epitaxial thin films using metalorganic vapor phase epitaxy (MOVPE). For the channel structure,…
Ultra-Wide Bandgap GaO-on-SiC MOSFETs
Yiwen Song, Arkka Bhattacharyya, Anwarul Karim +8
Ulta-wide bandgap semiconductors based on -GaO offer the potential to achieve higher power switching performance, efficiency, and lower manufacturing cost than today's w…
Low Resistance Ohmic Contact On Epitaxial MOVPE-grown -GaO and -(AlGa) O Films
Fikadu Alema, Carl Peterson, Arkka Bhattacharyya +3
We report on the realization of record low resistance Ohmic contacts to MOVPE-grown heavily Si-doped -GaO and -(AlGa) O epitaxial films. Transfer le…
High Permittivity Dielectric Field-Plated Vertical (001) -GaO Schottky Barrier Diode with Surface Breakdown Electric Field of 5.45 MV/cm and BFOM of 1 GW/cm
Saurav Roy, Arkka Bhattacharyya, Praneeth Ranga +3
This paper presents vertical (001) oriented -GaO field plated (FP) Schottky barrier diode (SBD) with a novel extreme permittivity dielectric field oxide. A thin drift la…
In-situ dielectric Al2O3/\b{eta}-Ga2O3 Interfaces Grown Using Metal-organic Chemical Vapor Deposition
Saurav Roy, Adrian E. Chmielewski, Arkka Bhattacharyya +5
High-quality dielectric-semiconductor interfaces are critical for reliable high-performance transistors. We report the in-situ metalorganic chemical vapor deposition (MOCVD) of Al$…