9 citations · 18 across the 7 of their papers we have counts for
7 papers
Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
John W. Simonaitis, Joseph A. Alongi, Benjamin Slayton +3
This work demonstrates electron energy loss spectroscopy of 2D materials in a 1-30 keV electron microscope, observing 100-times stronger electron-matter coupling relative to 125 ke…
Analysis and Applications of a Heralded Electron Source
Stewart A. Koppell, John W. Simonaitis, Maurice A. R. Krielaart +3
We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron ene…
Reduced ITO for Transparent Superconducting Electronics
Emma Batson, Marco Colangelo, John Simonaitis +6
Absorption of light in superconducting electronics is a major limitation on the quality of circuit architectures that integrate optical components with superconducting components.…
Secondary Electron Count Imaging in SEM
Akshay Agarwal, John Simonaitis, Vivek K. Goyal +1
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity o…
Precise, Sub-Nanosecond, and High-Voltage Switching of Complex Loads Enabled by Gallium Nitride Electronics
John W. Simonaitis, Benjamin Slayton, Yugu Yang-Keathley +2
In this work, we report the use of commercial Gallium Nitride (GaN) power electronics to precisely switch complex distributed loads, such as electron lenses and deflectors, without…
Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample
Navid Abedzadeh, M. A. R. Krielaart, Chung-Soo Kim +4
The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work,…
Image-Histogram-based Secondary Electron Counting to Evaluate Detective Quantum Efficiency in SEM
Akshay Agarwal, John Simonaitis, Karl K. Berggren
Scanning electron microscopy is a powerful tool for nanoscale imaging of organic and inorganic materials. An important metric for characterizing the limits of performance of these…