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physics.ins-det2021
Secondary Electron Count Imaging in SEM
Akshay Agarwal, John Simonaitis, Vivek K. Goyal +1
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity o…
physics.ins-det2021★ 8 cited
Precise, Sub-Nanosecond, and High-Voltage Switching of Complex Loads Enabled by Gallium Nitride Electronics
John W. Simonaitis, Benjamin Slayton, Yugu Yang-Keathley +2
In this work, we report the use of commercial Gallium Nitride (GaN) power electronics to precisely switch complex distributed loads, such as electron lenses and deflectors, without…