Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
arXiv:2410.09291 · doi:10.1103/tdfh-1ppp
Abstract
This work demonstrates electron energy loss spectroscopy of 2D materials in a 1-30 keV electron microscope, observing 100-times stronger electron-matter coupling relative to 125 keV microscopes. We observe that the universal curve relating beam energy to scattering holds for the transition from bulk graphite to graphene, albeit with a scale factor. We calculate that optimal coupling for most 2D materials and optical nanostructures falls in this range, concluding that spectroscopy of such systems will greatly benefit from use of this previously unexplored energy regime.
References in corpus (15)
- Electric Field Effect in Atomically Thin Carbon Films
- The structure of suspended graphene sheets
- Two-dimensional transition metal dichalcogenides under electron irradiation: defect production and doping
- On the roughness of single- and bi-layer graphene membranes
- An accurate measurement of electron beam induced displacement cross sections for single-layer graphene
- Ultrafast transmission electron microscopy using a laser-driven field emitter: femtosecond resolution with a high coherence electron beam
- Optical Excitations with Electron Beams: Challenges and Opportunities
- Ultrafast nano-imaging of the order parameter in a structural phase transition
- Cavity-mediated electron-photon pairs
- Cleaning graphene: comparing heat treatments in air and in vacuum
- High-purity free-electron momentum states prepared by three-dimensional optical phase modulation
- Quantum-coherent light-electron interaction in an SEM
- Mitigating E-beam-induced Hydrocarbon Deposition on Graphene for Atomic-Scale Scanning Transmission Electron Microscopy Studies
- Non-universal Transverse Electron Mean Free Path through Few-layer Graphene
- Combined electronic excitation and knock-on damage in monolayer MoS2