9 citations · 18 across the 7 of their papers we have counts for
4 papers · 1 filter
Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
John W. Simonaitis, Joseph A. Alongi, Benjamin Slayton +3
This work demonstrates electron energy loss spectroscopy of 2D materials in a 1-30 keV electron microscope, observing 100-times stronger electron-matter coupling relative to 125 ke…
Secondary Electron Count Imaging in SEM
Akshay Agarwal, John Simonaitis, Vivek K. Goyal +1
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity o…
Precise, Sub-Nanosecond, and High-Voltage Switching of Complex Loads Enabled by Gallium Nitride Electronics
John W. Simonaitis, Benjamin Slayton, Yugu Yang-Keathley +2
In this work, we report the use of commercial Gallium Nitride (GaN) power electronics to precisely switch complex distributed loads, such as electron lenses and deflectors, without…
Image-Histogram-based Secondary Electron Counting to Evaluate Detective Quantum Efficiency in SEM
Akshay Agarwal, John Simonaitis, Karl K. Berggren
Scanning electron microscopy is a powerful tool for nanoscale imaging of organic and inorganic materials. An important metric for characterizing the limits of performance of these…